Hey, I want to do a statistical corner analysis using 'statcrolles', which I can see in my corner file i.e. corners.scs. I am aware that this file is loaded in the model libraries or in the corners-section in ADE XL. for this, 1. Should I enable both process data and mismatch data or only process data? 2. What sampling method should i use- random or Latin hypercube or Low-discrepancy sequence ? 3. Should I Specify instance/devices ? I am using a sub-circuit and I want the inter-transistor mismatch for the corners statistically. 4. Also I would like to know, that in ELDO there are step to do monte carlo- statistical from .pcsf (process corner setup file) and .dcsf (design corner setup file). This allows the user to do statistical monte carlo in the ADE L itself. Will these results be same when done in ADE XL ? The kit came with the feasibility of Monte carlo in Spectre (ADE XL) and in ELDO (ADE L). 5. The standard deviation of my Monte Carlo results is low. I am afraid, if I am doing something wrong. Any guess on the mistake I am doing ? thanks in advance.
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