Cadence Technology Forums

Thanks Dave. I'll give this a try. Edwin

This doesn't deal with the hierarchy part, but, it's a starting point - since only pcells have superMasters cv=geGetEditCellView() pcells=setof(inst cv->instances inst->master->superMaster) pcellsInQuestion=setof(pcell pcells pcell->cellName=="myPcell") foreach(pcell pcellsInQuestion do stuff )

We have a polygon (not rectangle) at the top level, and pcells within that polygon's area, at various levels of hierarchy. We would like to read properties from all of those pcells. A version of geSelectArea that would allow a start and stop level, instead of only selecting in the top level, would accomplish the goal. dbGetOverlaps descends the hierarchy, and would work great if you could specify a non-rectangular search area. Any ideas? Thanks

Hi, I am wondering how to get a property into the 'available part properties' list when using Part Managers 'configure part properties display'. My end goal is to sort all the common parts by Page occurance. PM defaults to display the schematic, however this does not differentiate between occurances of the schematic when using hierarchical blocks. I tried to create a property for the design by RMB>Edit Object Properties on the .dsn and adding a new property, which I was going to use to differentiate the occurances, however this property is not available int the 'available part properties' list. Please let me know if you have advice. Thanks Jeff

We have had this problem. We were never able to find a suitable resolution. We have used Tortoise SVN as version control, which has a lock feature of its own that is very handy for this sort of thing.

geSelectArea can't support hierarchy, because you can't select hierarchical instances - so that wouldn't work. Probably what I would do is use dbGetOverlaps using the bBox of the polygonal area, and then transform the bBox of the instances found to the top level coordinate system, and then check whether they are in the polygonal area using the code in https://community.cadence.com/cadence_technology_forums/f/48/p/23921/1316116#1316116 The benefit of the dbGetOverlaps is that it will do the gross filtering and return the hierarchical references, and then you can save the SKILL point checking to just the remaining instances. Andrew.

will give it a shot, thanks. Do you have a feel for whether it would be more optimal / less code than either 1) breaking the original test polygon into primitive rectangles , calling dbGetOverlaps for each, and combining the results, or 2) doing an initial dbGetOverlaps, then for each item in the return value, do a reverse dbGetOverlaps using the bBox of the pcell as the test area and seeing whether the original test polygon is in the return list?

I don't think I could guess, because it is likely to be highly dependent upon the size of the region and how many tiles it would need, as well as the number of pcell instances you're likely to find. Even if I knew that I'm not sure I could guess which is likely to be the most efficient. Given the fact that you have abPointInPolygon, I don't think it's much code. Similarly fracturing the polygon (which could be done with dbLayerTile or the abe functions) won't be much code, nor would doing the reverse dbGetOverlaps. I suspect that in most cases any one would do and it wouldn't be worth re-implementing the other ways to find out unless there are a huge number of instances to check. Regards, Andrew

Ok, thanks again, this will definitely get us up and running.

Thank you for providing useful information.

Hi *, How can I trigger a procedure call when a simulation started with sevRun(sevSession) has finish the execution. Most likely there are multiple methods to start the simulation, but here we have some existing code that use sevRun() and I don't want to modify too much in the code if it is not necessary. Thank you, Marcel

Some comments from Cadence R&D on this: The motivation of high yield estimation for memory design is that it is challenging to run full memory module simulation. If users can run 3-sigma Monte Carlo for full memory module, there is no need to apply high yield analysis. This is not possible even applying fast simulator technology. Assuming memory cell or path are kind of independent of each other, designers will require memory cell has 6 sigma yield requirements in 1M module. Users typically run high yield for critical path as well. The yield requirement for critical path will be decided approximately how many critical paths can represent the memory module. SSS algorithm’s accuracy is not depending on size of circuit. So 7000 is OK to apply to critical memory path. Regards, Andrew.

You can manually type the name of your property in the Configure Part Properties Display GUI which will add it to the list which should resolve your issue.

Hi Andrew, Many thanks for your patient replies. It may be reasonable to use 7000 SSS points applied to memory critical path to get a high-sigma estimation. But still, the difficulty lies in that how to mapping the yield of critical path to that of the full memory module. In other words, in Monte Carlo simulation, if the critical path cannot be extended to 'look like' the full memory module in some way, we have no confidence to say the full memory module has 3 or 4 sigma yield even if the critical path has a 6-sigma yield. Regards, Tina

Hi Marcel, I don't think there's a public trigger for ADE L for when simulations complete, unfortunately. Regards, Andrew.

I have just completed the E-learning course and now getting started on a new design. Can someone point me to where the starter library should be on my C:\drive. I would have selected the default location during the installation of Allegro Pcb Editor. thanks

Hi highspeedio, id is the current that flows in the drain terminal, whereas ids is a current source within the bsim 4 model. You can find an equivalent circuit model of this transistor in the Virtuoso Simulator Components and Device Models Reference. I think the relation between Vdsat and gm/ids only applies in saturation mode and only for the square law model. Since you have here a very complex transistor model, which varies it's region during dc sweep, you can't apply this formula.

Amazing. That worked thank you. Do you know how the part manager can be organized by schematic page occurrence? Rather than just Schematic page? Other than creating a custom property and assigning it to all parts in that schematic page occurrence? Jeff

My problem is resolved and it was a tool issue. I was using irun version 15.20-s004. When I changed my tool version the issue was gone.

Hi Were you ever able to figure out what a potential solution to this was? I think I'm experiencing a similar issue; I'm able to set up and execute single runs but whenever I want to sweep a variable all the spooled up processes get stuck in "pending" and time out. Thanks

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Forum Post: RE: get pcells within a polygonal area, hierarchically

Forum Post: RE: get pcells within a polygonal area, hierarchically

Forum Post: RE: get pcells within a polygonal area, hierarchically

Forum Post: RE: get pcells within a polygonal area, hierarchically

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Forum Post: RE: How to determine Scaled-sigma sampling (SSS) Number in high-yield estimation (HYE) for SRAM design? Thanks

Forum Post: RE: 'Available Part Properties' in part manager, and sorting by hierarchical occurance in PM

Forum Post: RE: How to determine Scaled-sigma sampling (SSS) Number in high-yield estimation (HYE) for SRAM design? Thanks

Forum Post: RE: How to call a procedure when a simulation started with sevRun(sevSession) ends

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Forum Post: RE: 'Available Part Properties' in part manager, and sorting by hierarchical occurance in PM

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